Sheet resistance and OD meters

We have been building sheet resistance measuring devices since 1981.

Through continuous development and improvements, we can now offer a range of devices.
Basically we differentiate between on-line (in-situ)
and off-line (laboratory) measuring devices.

Measurable substrates/applications, such as:

  • Packaging film
  • Capacitor foil
  • Sun protection film
  • Coated glass (Low-E; ITO)
  • Solar cell production (wafers)
  • Flexible circuit boards
  • Metallized paper (deco)
  • EMC shields
  • Metallized textiles
  • Galvanically applied layers

SD-810

Measuring device for measuring sheet resistance

SDKR-13 & SDKR-25

Four-point measuring stylus for SD-800
and 1.3 and 2.5 mm versions

E-650

Calibration box for checking measuring devicesType SD-800 (also SD-600/SD-510/SD-460)

Stratometer G

Hand-held measuring device for contactless
Measurement of the sheet resistance with
High-frequency measurement method

SRM-14T

Measuring device for contactless measurement of sheet resistance

SRM-14TS

Like SRM-14T, but for measuring small areas, such as segmented coated films

SRM-14OD

Like SRM-14T, but also with integrated sensor for optical density (OD)

SRM-50

SRM-50 series: The measuring device for continuous, non-contact on-line measurement (!) and monitoring of the sheet resistance

CRT-1

Combined measuring device for continuous, non-contact on-line measurement and monitoring of sheet resistance and optical density


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